Particularly precise (6 nm spatial resolution, 2-3 atomic monolayers volume (depth) resolution) identification of surface and volumetric (up to 1-2 μm depth) derivatives, determination of elemental composition, obtainment of chemical (bond) information. Problems and limitations can be found when testing dielectric specimens in particular.
Particularly precise (6 nm spatial resolution, 2-3 atomic monolayers volume (depth) resolution) identification of surface and volumetric (up to 1-2 μm depth) derivatives, determination of elemental composition, obtainment of chemical (bond) information. Problems and limitations can be found when testing dielectric specimens in particular.
Quick, low-precision (spatial accuracy about 2-4 millimeters, profiling depth precision tens-hundreds nanometers) qualitative and quantitative elemental composition analysis. Ability to perform depth profiling, composition control and comparison between surface and deeper layers.
Using inert gas fusion principle we carry out an accurate analysis of even very small amounts of nitrogen, oxygen and hydrogen in various materials. Measurements require up to 1-2g of the test substance that is melted at high temperature during the analysis and the amount of gas released is measured.
Qualitative and quantitative measurements of optical bandwidth in the spectral range of 163-1100 nm.
Variable pressure scanning electron microscope can be used to analyze both conductive and dielectric samples. It is also possible to analyze biological objects with certain limitations. SEM resolution at 30 kV accelerating voltage is 3 nm, while at 3 kV accelerating voltage, 8-10 nm resolution is achieved. We can create images with both secondary and reflective electron detectors, so there is a possibility to separately highlight the unevenness of sample morphology, elemental composition, and extract detailed pseudo 3D images.
Quantitative and qualitative determination of the elemental composition of the sample by detecting chemical elements from Boro5 to Americio95 at the selected point (spatial resolution 1-2 μm, depending on the measurement conditions, information is obtained from 0.5-2 μm depth). It is also possible to map the distribution of individual chemical elements in the sample area.
All crystalline phases in the sample can be determined by one measurement. There are also extended possibilities for diffraction measurements at the same time controlling the ambient temperature (from liquid nitrogen to 1600 oC) and the surrounding environment (high vacuum can be used or the desired amount of gas (suitable for many gases) up to a maximum pressure of 5 bar).
Ability to perform sample analysis using a high-quality optical microscope with the ability to store images in high-resolution photos. Microscope enhancement is selected between 100, 200, 500 and 1000 times. The photos are made with the NIKON DSF-1Fi digital camera specially designed for optical microscopy with a resolution of 2560 x 1920 pixels.
Database Creation and Management.
